Software for X-ray powder diffraction pattern analysis
From powder diffractionists to powder diffraction community.
Recently available products:
ZDS System version 6.x for DOS
ZDS System version 1.0 for Window '95
Integrated system for powder XRD step-scanned data analysis and management profiting from file managing features and multitasking capabilities of Windows95 operating system. Simple file operations (copying, moving, deleting ...), launching of procedures from a toolbar or using icons just on one or several mouse clicks and/or drag-and-drops. Possibility to group individual files of particular interest in one catalogue described by user selected name. Instant preview of patterns before their loading saves time and prevents loading of unwanted patterns. Search/Match procedure cooperating with PDF2 database by ICDD-JCPDS allows to identify up to 10 phases in powder pattern and supports very easy work with sheets in MS Access format.The system is designed to be operated on recent PC compatible machines with quite good performance and W95. Other features like profile-fitting, unit-cell parameters refinement, Boolean search in PDF2 database, whole powder pattern fitting and more will be available early.
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